Convert Measurement Data into Accurate Models

Generating data that can be relied upon with absolute confidence is a cornerstone of IVCAD's offering. Transforming this measurement data into an equivalent model for accurate simulation work makes it even more valuable. IVCAD Suite Modeling offers  the use of synchronized pulsed current/voltage and S-parameter measurements to create nonlinear transistor models for designing integrated RF circuits. These models can be implemented in commercial circuit simulators widely used in the industry and validated by comparing measurement results with load-pull simulations.

IVCAD Modeling also allows for the conversion of measurements made on RF circuits such as power amplifiers into equivalent behavioral models, integrating numerous complex phenomena such as nonlinear behavior or memory effects.

IVCAD Suite Modeling - IVM

Use IVCAD for Transistor Compact Model Extraction

A compact transistor model is an equivalent representation of different elements that describes the physical phenomena occurring in the component to accurately simulate the linear and nonlinear behavior of the component.

Unlike a pure black box mathematical model, a compact model is inspired by the physical phenomena of semiconductors through an equivalent diagram composed of linear elements (resistors, capacitors, inductors) and non-linear elements (current sources, diodes, capacitors), represented using mathematical equations in order to mimic the behavior of the transistor.

The main objective of such a model is to capture the main physical phenomena and characteristics with a minimum of parameters to facilitate its integration and limit convergence problems in circuit simulations.

The model must address several key points, such as highlighting DC current and voltage dependencies, nonlinear behavior, and thermal effects. IVCAD (IVM) offers a user-friendly software interface and a specific equation editor that allows to create custom models for each nonlinearities for HEMT/pHEMT device (like GaN, GaAs…) to simulate the DC performance of the component. In a same manner, an efficient compact modeling flow has been developed for LDMOS transistors, with different capacitance models available (hyperbolic tangent, gaussian..).

Highlight Thermal Dependencies

Once the model is able to fit the pulse Voltage & Current characteristics, it is essential to upgrade this one with a thermal circuit that represents its dynamic self-heating behavior.

In RF transistors, the dissipated power depends on the operating conditions (e.g., bias point, signal power, frequency). This power causes a rise in junction temperature. For high-signal (high-power) operation, the power dissipation is usually calculated from the dynamic characteristics of the device.

This self-heating is particularly important when considering the impact of thermal effects on performance at higher power levels. For small signals, power dissipation is typically related to the quiescent current (IDQ) and operating voltage (VDQ). For large signals, the instantaneous power dissipation depends on the input signal, requiring timing analysis or integration of the device power over the signal period.

IVCAD (IVM) offers a turnkey solution for modeling thermal phenomena for each of the model’s parameters in order to introduce a dynamic temperature dependence.

Implement Trapping Effect Memories in GaN Technologies

Trapping effects in GaN (Gallium Nitride) transistors, especially in high-power and high-frequency applications, can significantly affect the transistor's performance. These effects occur due to the trapping and de-trapping of charge carriers in the semiconductor material or at the interface between different layers in the device.

Trapping can lead to issues like dynamic threshold voltage shifts, transient effects, and degraded switching behavior, all of which are critical for accurate RF transistor modeling. To extract a GaN transistor model that accounts for trapping effects, you need to carefully characterize the device using time-dependent measurements and incorporate these effects into your compact model.

These parasitic phenomena is revealed by Pulsed I-V measurements which isolate the dynamic response and transient recovery from trapped charges from thermal effects. Indeed, since trapping effects are often temperature-dependent, measuring the device's performance at different temperatures is mandatory.

IVCAD (IVM) has been developed to model the different time constants for trap capture and emission of electrons at different energy levels to predict the threshold voltage shifts and transconductance degradation.

Fit the Nonlinear RF Behavior in Load Pull Conditions

Once the current source model is developed, other elements of the model such as nonlinear capacitances and diodes must be extracted to simulate the actual behavior of the component under different operating conditions as a function of temperature, frequencies, bias voltages, and source and load impedances.

The compact model must account for the variation of output power and efficiency as a function of load impedance, as this is the core of load-pull simulations for a reliable circuit design process based on this model.

To achieve an accurate fit to nonlinear load-pull measurements in a compact transistor model, several key model elements must be carefully addressed. The model must capture the nonlinearities due to these high-power signal conditions.

IVCAD (IVM) allows optimization of multiple model parameters to fit load pull data without degrading IV and S parameter simulations by refining the current source model, nonlinear capacitances, memory plus thermal effects, and bias-dependent parameters.

Export IVCAD Transistor Model in RF Circuit Simulators

IVCAD (IVM) does enable the export of transistor compact models to third-party circuit simulators.

While IVCAD provides a set of tools to extract, calibrate, and refine compact models for these GaN, GaAs and LDMOS devices, such models can be exported to various third-party circuit simulators. The software enables the export of transistor compact models to third-party circuit simulators.

File Formats: IVCAD (IVM) usually exports models in common formats such as Netlists that can be read by most circuit simulators. This export process allows seamless integration of the generated transistor model into a broader simulation environment where the performance of the transistor can be analyzed in larger circuit contexts.

Interfacing:  IVCAD (IVM) software has direct support for integration with these simulators and provides specific tools for the correct setup of the exported models, such as ensuring that model parameters and component connections are properly mapped to the third-party simulation environment.

Create a Behavioral Transistor Model Just Using Load Pull Data

Extracting a transistor model generally requires skills, time, and various types of measurements, which can make this process unaffordable when the time and budget of the amplifier design team's are limited. Behavioral models are useful in several applications : to hide the details of the transistor specifics while concentrating on its performance and response, to improve the speed of simulation or to model a packaged component.

IVCAD Suite Modeling permits to use large signal data provided by the  IVCAD Measurement Suite Specialized (IVZ) to extract a transistor model from these measurements that can reproduce the transistor behavior during a Harmonic Balance simulation. Models can allow interpolation or extrapolation of the transistor performance for different matching conditions and various harmonic load impedances.

This model can be parametric, meaning it can be extracted for different bias, temperatures and frequencies, to cover the operating conditions required for simplified design of the final circuit.

Also Discover

IVCAD Suite
Unify Radio-Frequency measurement, modeling, and simulation workflows
IVCAD Suite Measurement Standard
Conduct advanced tests on RF transistors for model extraction, begin passive load pull measurements, and test and linearize RF power amplifiers.
IVCAD Suite Measurement Specialized
Waveguide measurement setups ctrl, Active Load Pull measurements, Data generation for advanced component and circuit modeling
IVCAD Suite Simulation
Run Stability Analysis of MMIC Circuits, Perform System Simulation using behavioral models
IVCAD Suite Frontend
Define RF signal testing models, start with basic measurements and create custom measurement or simulation scripts and templates for data analysis

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